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ElProScan | Bilayer | Optical Systems | Patch Clamp

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	ElProScan
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ElProScan	The HEKA ElProScan is a high-resolution Electrochemical Probe Scanner which can be used as a Scanning Electrochemical Microscope (SECM).
The ElProScan system provides many unique features: Closed-loop control for all axis (X,Y,Z) and the Z-Piezo Easy to use automatic calibration of the positioning system and the bipotentiostat Low noise recording of very low currents below 1 pA Integrated real-time computer system for real constant velocity scans and real-time slope compensation Real-time controlled constant distance scan with fully integrated shear-force unit 3D-Matrix scan with freely programmed electrochemical techniques Template scan over de?ned planar structures	The two examples of different high-resolution ElProScan systems below differ with respect to the positioning system and required usage by the customer. Due to the fact that these systems can be purchased individually, there is room for customization of systems to suit your individual requirements. Please contact HEKA directly.

ELP 10 - ElProScan HR XY: 10 nm resolution adapted to fit on inverted microscope The system contains all of the individual components previously listed with a positioning system offering 10nm resolution on all three motor axis and 3 nm with the additional Piezo on the z-axis.

ELP 11 - ElProScan HR XY: 10 nm resolution adapted to fit on inverted microscope Same as above but the positioning system on a rail system adapted to fit over an inverted microscope

	ElProScan Options

SFU 3 Shear Force Unit for ElProScan Measures current less the height profile of structured samples. The SFU 3 upgrades the ElProScan systems (ABO 11 Rev. 2 and later) to add the "constant distance" scan mode.